Selective sensitivity of ellipsometry to magnetic nanostructures

"Introduction" to Advanced Magnetic Nanostructures

Magnetic Materials (Appendix to Advanced Magnetic Nanostructures [2006])

Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization.

This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...

Magnetic surface nanostructures.

Recent trends in the emerging field of surface-supported magnetic nanostructures are reviewed. Current strategies for nanostructure synthesis are summarized, followed by a predominantly theoretical description of magnetic phenomena in surface magnetic structures and a review of experimental research in this field. Emphasis is on Fe- or Co-based nanostructures in various low-dimensional geometri...

Relaxation in magnetic nanostructures